Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique

Powder metallurgy science

Materials & Design (1980-2015) · 1984 · 1.3K citations

Applications of the FIB lift-out technique for TEM specimen preparation

Lucille A. Giannuzzi, J. L. Drown, Steve R Brown et al. · Microscopy Research and Technique · 1998 · 296 citations · Full text

Engineering, Materials Engineering, Materials Science +14

Novel scheme for the preparation of transmission electron microscopy specimens with a focused ion beam

M.H.F. Overwijk, F.C. van den Heuvel, C. W. T. Bulle‐Lieuwma · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1993 · 258 citations

Engineering, Electrical Engineering, Materials Science +12

Characteristics of silicon removal by fine focused gallium ion beam

Hiroshi Yamaguchi, Akira Shimase, Satoshi Haraichi et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1985 · 84 citations

Engineering, Electrical Engineering, Manufacturing Engineering +13

Applications of focused ion beams in microelectronics production, design and development

F. A. Stevie, T. C. Shane, P. M. Kahora et al. · Surface and Interface Analysis · 1995 · 71 citations

Engineering, Materials Engineering, Materials Science +16