S. R. Brown

Focused Ion Beam Milling and Micromanipulation Lift-Out for Site Specific Cross-Section Tem Specimen Preparation

Lucille A. Giannuzzi, J. L. Drown, S. R. Brown et al. · MRS Proceedings · 1997 · 158 citations · Full text

Engineering, Materials Engineering, Materials Science +13

The Correlation between Ion Beam/Material Interactions and Practical FIB Specimen Preparation

B. I. Prenitzer, C.A. Urbanik-Shannon, Lucille A. Giannuzzi et al. · Microscopy and Microanalysis · 2003 · 101 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +14

Application of focused ion beam lift‐out specimen preparation to TEM, SEM, STEM, AES and SIMS analysis

F. A. Stevie, C. B. Vartuli, Lucille A. Giannuzzi et al. · Surface and Interface Analysis · 2001 · 97 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15

Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique

B. I. Prenitzer, Lucille A. Giannuzzi, Karla Newman et al. · Metallurgical and Materials Transactions A · 1998 · 77 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +14

Residual stress measurement in thermal sprayed hydroxyapatite coatings

S. R. Brown, I G Turner, H. Reiter · Journal of Materials Science Materials in Medicine · 1994 · 68 citations

Natural Sciences, Materials Engineering, Materials Science +14