T. L. Shofner

The Correlation between Ion Beam/Material Interactions and Practical FIB Specimen Preparation

B. I. Prenitzer, C.A. Urbanik-Shannon, Lucille A. Giannuzzi et al. · Microscopy and Microanalysis · 2003 · 101 citations

Materials Science, Materials Engineering, Ion Implantation +15

Application of focused ion beam lift‐out specimen preparation to TEM, SEM, STEM, AES and SIMS analysis

F. A. Stevie, C. B. Vartuli, Lucille A. Giannuzzi et al. · Surface and Interface Analysis · 2001 · 97 citations

Engineering, Microscopy, Sims Analysis +23

Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique

B. I. Prenitzer, Lucille A. Giannuzzi, Karla Newman et al. · Metallurgical and Materials Transactions A · 1998 · 77 citations

Materials Science, Materials Engineering, Zn Powders +11

Plan view TEM sample preparation using the focused ion beam lift-out technique

F. A. Stevie, R. B. Irwin, T. L. Shofner et al. · 1998 · 32 citations · Full text

Lift-out Technique, Engineering, Electron-beam Lithography +21

Direct observation of void morphology in step-like electromigration resistance behavior and its correlation with critical current density

Jia-Sheng Huang, T. L. Shofner, J. Zhao · Journal of Applied Physics · 2001 · 31 citations

Engineering, Resistance Steps, Interconnect (Integrated Circuits) +18