M.H.F. Overwijk - Concepedia

Author

M.H.F. Overwijk

Philips (Netherlands)

Also Known As

M. H. F. Overwijk, M.H.F Overwijk, M.H.F. Overwijk, MHF Overwijk

Publications

598

Citations

H-Index

Concepts

All Affiliations

Philips (Netherlands)Philips (Finland)Delft University of Technology

About

M.H.F. Overwijk is an author at Philips (Netherlands) specializing in applied physics, engineering, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	9	9	503
2	Applied Physics	9	9	434
3	Natural Sciences	2	2	63
4	Medicine	1	1	100
5	Computer Engineering	1	1	256

M.H.F. Overwijk

Publications

534

Citations

H-Index

Page 1

	Year	Citations
Novel scheme for the preparation of transmission electron microscopy specimens with a focused ion beam M.H.F. Overwijk, F.C. van den Heuvel, C. W. T. Bulle‐Lieuwma Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringTransmission Electron MicroscopyMicroscopyIntegrated CircuitsElectron Microscopy	1993	256
Numerical correction of lens aberrations in phase-retrieval HRTEM A. Thust, M.H.F. Overwijk, W. Coene, Ultramicroscopy EngineeringOphthalmologyMicroscopyOptical PropertiesGeometrical Optic	1996	100
Brightness measurements of a ZrO/W Schottky electron emitter in a transmission electron microscope M. Fransen, M.H.F. Overwijk, P. Kruit Applied Surface Science Electrical EngineeringEngineeringElectron MicroscopyPhysicsMicroscopy	1999	32
Maximum-entropy deconvolution applied to electron energy-loss spectroscopy M.H.F. Overwijk, D Reefman Micron PhysicsElectron SpectroscopyNatural SciencesSpectroscopyApplied Physics	2000	31
Proximity gettering of transition metals in silicon by ion implantation M.H.F. Overwijk, J. Politiek, R.C.M. de Kruif, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms Materials ScienceIon ImplantationProximity GetteringEngineeringPhysics	1995	31
Focused-ion-beam-induced tungsten deposition: theory and experiment M.H.F. Overwijk, F.C. van den Heuvel Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms Ion ImplantationEngineeringPhysicsFocused-ion-beam-induced Tungsten DepositionSurface Science	1993	20
Correction of three-fold astigmatism for ultra-high-resolution TEM M.H.F. Overwijk, Arno J. Bleeker, A. Thust Ultramicroscopy Three-fold AstigmatismHigh ResolutionEngineeringMedical ImagingMicroscopy	1997	18
The active dopant concentration in ion implanted indium tin oxide thin films T.J. Vink, M.H.F. Overwijk, W. Walrave Journal of Applied Physics Optical MaterialsEngineeringOptoelectronic DevicesThin Film Process TechnologyBand Gap	1996	18
Off-axis holography with a crystal beam splitter Bionda Mertens, M.H.F. Overwijk, P. Kruit Ultramicroscopy HolographyPhotonicsEngineeringPhysicsMicroscopy	1999	15
Focused-ion-beam-induced tungsten deposition for IC repair F.C. van den Heuvel, M.H.F. Overwijk, E. M. Fleuren, Microelectronic Engineering Materials EngineeringMaterials ScienceIon ImplantationEngineeringFocused-ion-beam-induced Tungsten Deposition	1993	13

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