M.H.F. Overwijk

Novel scheme for the preparation of transmission electron microscopy specimens with a focused ion beam

M.H.F. Overwijk, F.C. van den Heuvel, C. W. T. Bulle‐Lieuwma · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1993 · 256 citations

Engineering, Transmission Electron Microscopy, Microscopy +17

Numerical correction of lens aberrations in phase-retrieval HRTEM

A. Thust, M.H.F. Overwijk, W. Coene et al. · Ultramicroscopy · 1996 · 100 citations

Engineering, Ophthalmology, Microscopy +7

Brightness measurements of a ZrO/W Schottky electron emitter in a transmission electron microscope

M. Fransen, M.H.F. Overwijk, P. Kruit · Applied Surface Science · 1999 · 32 citations

Electrical Engineering, Engineering, Electron Microscopy +14

Maximum-entropy deconvolution applied to electron energy-loss spectroscopy

M.H.F. Overwijk, D Reefman · Micron · 2000 · 31 citations

Physics, Electron Spectroscopy, Natural Sciences +4

Proximity gettering of transition metals in silicon by ion implantation

M.H.F. Overwijk, J. Politiek, R.C.M. de Kruif et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1995 · 31 citations

Materials Science, Ion Implantation, Proximity Gettering +8