X-ray CTR scattering measurement of InP/InGaAs/InP interface structures fabricated by different growth processes

Crystal truncation rods and surface roughness

Ian Robinson · Physical review. B, Condensed matter · 1986 · 945 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +20

Surface X-ray diffraction

Ian Robinson, D. J. Tweet · Reports on Progress in Physics · 1992 · 756 citations

Materials Science, X-ray Crystallography, General Introduction +11

X-ray interference method for studying interface structures

Ian Robinson, R. T. Tung, R. Feidenhans’l · Physical review. B, Condensed matter · 1988 · 118 citations

X-ray Spectroscopy, Engineering, Chemistry +17

Atomic scale characterization of organometallic vapor phase epitaxial growth using in-situ grazing incidence X-ray scattering

D. W. Kisker, G. B. Stephenson, P. H. Fuoss et al. · Journal of Crystal Growth · 1992 · 73 citations

Materials Science, X-ray Crystallography, X-ray Spectroscopy +13

X-ray crystal truncation rod scattering measurement of AsH3-exposed InP/InPAs/InP single heterostructures

Yoshikazu Takeda, Yoshiyuki Sakuraba, K. Fujibayashi et al. · Applied Physics Letters · 1995 · 57 citations

Materials Science, X-ray Crystallography, Materials Engineering +14