P. H. Fuoss

Structural relaxation and defect annihilation in pure amorphous silicon

S. Roorda, W.C. Sinke, J. M. Poate et al. · Physical review. B, Condensed matter · 1991 · 409 citations

Materials Science, Materials Engineering, Amorphous Si +14

Ultrafast Bond Softening in Bismuth: Mapping a Solid's Interatomic Potential with X-rays

David Fritz, David A. Reis, Bernhard W. Adams et al. · Science · 2007 · 396 citations · Full text

Atomic-Scale Visualization of Inertial Dynamics

A. M. Lindenberg, Jörgen Larsson, K. Sokolowski-Tinten et al. · Science · 2005 · 363 citations

Quantum Liquid, Real-time Visualization, Engineering +18

Application of Differential Anomalous X-Ray Scattering to Structural Studies of Amorphous Materials

P. H. Fuoss, P. Eisenberger, W. K. Warburton et al. · Physical Review Letters · 1981 · 294 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +16

Clocking Femtosecond X Rays

A. L. Cavalieri, D. M. Fritz, S. H. Lee et al. · Physical Review Letters · 2005 · 265 citations · Full text

Photonics, Engineering, Short Pulse Duration +10