P. H. Fuoss - Concepedia

Author

P. H. Fuoss

AT&T (United States)

Also Known As

Fuoss, P. H., P Fuoss, P. Fuoss, P. H. Fuoss, P.H. Fuoss

Publications

3.2K

Citations

H-Index

Concepts

All Affiliations

AT&T (United States)Argonne National Laboratory Stanford Synchrotron Radiation Lightsource Deutsches Elektronen-Synchrotron DESY University of California, Berkeley

About

P. H. Fuoss is an author at AT&T (United States) specializing in engineering, physics, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	21	24	2.2K
2	Applied Physics	20	23	1.9K
3	Natural Sciences	11	11	1K
4	Chemistry	3	3	136
5	Electrical Engineering	2	2	51

P. H. Fuoss

Publications

2.6K

Citations

H-Index

Page 1

	Year	Citations
Structural relaxation and defect annihilation in pure amorphous silicon S. Roorda, W.C. Sinke, J. M. Poate, Physical review. B, Condensed matter Materials ScienceMaterials EngineeringAmorphous SiPoint DefectsEngineering	1991	409
Ultrafast Bond Softening in Bismuth: Mapping a Solid's Interatomic Potential with X-rays David Fritz, David A. Reis, Bernhard W. Adams, Science	2007	396
Atomic-Scale Visualization of Inertial Dynamics A. M. Lindenberg, Jörgen Larsson, K. Sokolowski-Tinten, Science Quantum LiquidReal-time VisualizationEngineeringSimple LiquidFirst Order	2005	363
Application of Differential Anomalous X-Ray Scattering to Structural Studies of Amorphous Materials P. H. Fuoss, P. Eisenberger, W. K. Warburton, Physical Review Letters X-ray CrystallographyX-ray SpectroscopyEngineeringTwofold CoordinationStructural Materials	1981	294
Clocking Femtosecond X Rays A. L. Cavalieri, D. M. Fritz, S. H. Lee, Physical Review Letters PhotonicsEngineeringShort Pulse DurationPhysicsX-ray Pulse Duration	2005	265
Observation of strain in the Si(111) 7×7 surface Ian Robinson, W. K. Waskiewicz, P. H. Fuoss, Physical review. B, Condensed matter X-ray CrystallographyMaterials ScienceSurface CharacterizationX-ray SpectroscopyEngineering	1988	87
X-ray diffraction evidence of adatoms in the Si(111)7×7 reconstructed surface Ian Robinson, W. K. Waskiewicz, P. H. Fuoss, Physical review. B, Condensed matter EngineeringElectron DiffractionSilicon On InsulatorOptical PropertiesX-ray Diffraction Evidence	1986	83
Critical thickness of high structural quality SrTiO3 films grown on orthorhombic (101) DyScO3 Michael D. Biegalski, D. D. Fong, J. A. Eastman, Journal of Applied Physics Critical ThicknessEngineeringSemiconductorsSuperconductivityMolecular Beam Epitaxy	2008	66
Observation of Structural Anisotropy and the Onset of Liquidlike Motion During the Nonthermal Melting of InSb Kelly J. Gaffney, A. M. Lindenberg, Jörgen Larsson, Physical Review Letters EngineeringLaser AblationStructural AnisotropyDelayed OnsetNonthermal Melting	2005	60
Native oxidation of the Si(001) surface: Evidence for an interfacial phase G. Renaud, P. H. Fuoss, A. Ourmazd, Applied Physics Letters Materials ScienceNative OxidationSurface CharacterizationEngineeringPhysics	1991	59

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