D. J. Tweet - Concepedia

Author

D. J. Tweet

University of Washington ORCID

Also Known As

D J Tweet, D. J. Tweet, D.J. Tweet, DOUGLAS J. TWEET, Douglas J Tweet, Douglas J. Tweet, Douglas TWEET, Douglas Tweet

Publications

1.8K

Citations

H-Index

Concepts

All Affiliations

University of Washington Polish Academy of Sciences NEC (Japan)Institute of Physical Chemistry

About

D. J. Tweet is an author at University of Washington specializing in engineering, applied physics, and thin films.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	15	21	1.7K
2	Applied Physics	15	21	1.7K
3	Natural Sciences	5	5	1.1K
4	Chemistry	3	3	229
5	Chemical Engineering	1	1	41

D. J. Tweet

Publications

1.7K

Citations

H-Index

Page 1

	Year	Citations
Surface X-ray diffraction Ian Robinson, D. J. Tweet Reports on Progress in Physics Materials ScienceX-ray CrystallographyGeneral IntroductionEngineeringPhysics	1992	756
Layer-by-Layer Surface Freezing of Freely Suspended Liquid-Crystal Films Brian D. Swanson, Hans Stragier, D. J. Tweet, Physical Review Letters Materials ScienceLayer-by-layer Surface FreezingSurface LayersSimple Power-law FormEngineering	1989	104
X-ray determination of the molecular tilt and layer fluctuation profiles of freely suspended liquid-crystal films D. J. Tweet, Robert Hołyst, Brian D. Swanson, Physical Review Letters Tilt ProfilesEngineeringFluid MechanicsCrystal FormationInterlayer Structure	1990	99
Atomic layer deposition of thin hafnium oxide films using a carbon free precursor John F. Conley, Y. Ono, D. J. Tweet, Journal of Applied Physics Materials ScienceDielectric ConstantEngineeringResidual NitratesOxide Electronics	2002	85
Atomic layer deposition of two dimensional MoS2 on 150 mm substrates Arturo Gerardo Valdivia‐Flores, D. J. Tweet, John F. Conley Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Few Layer Mos2EngineeringChemistryChemical DepositionH2s Precursors	2016	84
Fluctuations in thin smectic-<i>A</i>films Robert Hołyst, D. J. Tweet, L. B. Sorensen Physical Review Letters Materials ScienceThin Film PhysicsParabolic ProfileEngineeringPhysics	1990	83
Deposition of highly crosslinked fluorinated amorphous carbon film and structural evolution during thermal annealing Hongning Yang, D. J. Tweet, Yanjun Ma, Applied Physics Letters Materials EngineeringMaterials ScienceElectrical EngineeringEngineeringGlassy Carbon	1998	75
Atomic layer deposition of MoS<sub>2</sub> thin films Robert Browning, Prasanna Padigi, Raj Solanki, Materials Research Express Materials ScienceSurface TechnologyElectrical EngineeringSemiconductorsEngineering	2015	74
Conservation of bond lengths in strained Ge-Si layers J. C. Woicik, C. E. Bouldin, M. I. Bell, Physical review. B, Condensed matter Materials ScienceMaterials EngineeringEpitaxial GrowthEngineeringPhysics	1991	60
Characterization and reduction of twist in Ge on insulator produced by localized liquid phase epitaxy D. J. Tweet, Jong Jan Lee, Jer‐Shen Maa, Applied Physics Letters Epitaxial GrowthGe Crystal PlanesEngineeringMelting TemperaturePhysics	2005	45

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