John F. Conley

What can electron paramagnetic resonance tell us about the Si/SiO2 system?

P. M. Lenahan, John F. Conley · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1998 · 341 citations

Paramagnetic Resonance, Engineering, Magnetic Resonance +19

Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors

John F. Conley · IEEE Transactions on Device and Materials Reliability · 2010 · 255 citations

Engineering, Organic Electronics, Optoelectronic Devices +17

Dielectrophoretically Controlled Fabrication of Single-Crystal Nickel Silicide Nanowire Interconnects

Lifeng Dong, Jocelyn Bush, Vachara Chirayos et al. · Nano Letters · 2005 · 121 citations

Materials Science, Nano Application, Nanoscale System +13

Electron spin resonance observation of trapped electron centers in atomic-layer-deposited hafnium oxide on Si

A.Y. Kang, Patrick M. Lenahan, John F. Conley · Applied Physics Letters · 2003 · 118 citations

Materials Science, Spintronics, Engineering +14

Advancing MIM Electronics: Amorphous Metal Electrodes

E. William Cowell, Nasir Alimardani, Christopher C. Knutson et al. · Advanced Materials · 2010 · 117 citations

Materials Science, Engineering, Tunneling Microscopy +15