A.Y. Kang - Concepedia

Author

A.Y. Kang

Pennsylvania State University

Also Known As

A. Kang, A. Y. Kang, A.Y. Kang, Aram Kang, Arim Kang, The Korean Production And Operations Management Society

Publications

347

Citations

H-Index

Concepts

All Affiliations

Pennsylvania State University Micron (United States)Honeywell (United States)

About

A.Y. Kang is an author at Pennsylvania State University specializing in physics, applied physics, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	328
2	Applied Physics	6	6	328
3	Physics	6	6	328
4	Electrical Engineering	5	5	210
5	Materials Science	2	2	172

A.Y. Kang

Publications

339

Citations

H-Index

Page 1

	Year	Citations
Electron spin resonance observation of trapped electron centers in atomic-layer-deposited hafnium oxide on Si A.Y. Kang, Patrick M. Lenahan, John F. Conley Applied Physics Letters Materials ScienceSpintronicsEngineeringPhysicsOxide Electronics	2003	118
The radiation response of the high dielectric-constant hafnium oxide/silicon system A.Y. Kang, Patrick M. Lenahan, John F. Conley IEEE Transactions on Nuclear Science Electrical EngineeringEngineeringBare Oxide StructuresPhysicsNanoelectronics	2002	81
Electron spin resonance study of interface defects in atomic layer deposited hafnium oxide on Si A.Y. Kang, P. M. Lenahan, John F. Conley, Applied Physics Letters EngineeringSilicon On InsulatorDefect ToleranceAtomic LayerSemiconductor Device	2002	54
Identification of the atomic scale defects involved in radiation damage in HfO/sub 2/ based MOS devices Jason T. Ryan, Patrick M. Lenahan, A.Y. Kang, IEEE Transactions on Nuclear Science EngineeringOxygen Vacancy CenterAtomic Scale DefectsSilicon On InsulatorDefect Tolerance	2005	41
Radiation-induced leakage currents: atomic scale mechanisms R.M. Lenahan, J. P. Campbell, A.Y. Kang, IEEE Transactions on Nuclear Science Electrical EngineeringEngineeringPhysicsNanoelectronicsRilc Tolerance	2001	21
Noninvasive nature of corona charging on thermal Si∕SiO2 structures Morgan S. Dautrich, P. M. Lenahan, A.Y. Kang, Applied Physics Letters EngineeringDefect ToleranceReliability EngineeringThermal Si∕sio2 StructuresThermodynamics	2004	13
Direct experimental evidence linking silicon dangling bond defects to oxide leakage currents Patrick M. Lenahan, J.J. Mele, J. P. Campbell,	2002	11

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