Surface X-ray diffraction

Abstract

A general introduction to X-ray diffraction and its application to the study of surfaces and interfaces is presented. The application of X-ray diffraction to various problems in surface and interface science is illustrated through five different techniques: crystal truncation rod analysis; two-dimensional crystallography; three-dimensional structure analysis; the evanescent wave method; and lineshape analysis. These techniques are explained with numerous examples from experiments and with the aid of an extensive bibliography.