R. Feidenhans’l

Surface structure determination by X-ray diffraction

R. Feidenhans’l · Surface Science Reports · 1989 · 778 citations

X-ray Crystallography, Materials Science, Engineering +6

Structure of thin films of poly(3,4-ethylenedioxythiophene)

Knut E. Aasmundtveit, E.J. Sämuelsen, Leif A. A. Pettersson et al. · Synthetic Metals · 1999 · 417 citations

Materials Science, Engineering, Polymer Science +5

Two-dimensional epitaxial superconductor-semiconductor heterostructures: A platform for topological superconducting networks

Javad Shabani, Henri Suominen, Younghyun Kim et al. · Physical review. B./Physical review. B · 2016 · 328 citations · Full text

Quantitative x-ray dark-field computed tomography

Martin Bech, Oliver Bunk, Tilman Donath et al. · Physics in Medicine and Biology · 2010 · 227 citations

Computed Tomography, Engineering, Microscopy +16

Model-Independent Structure Determination of the InSb(111)2×2 Surface with Use of Synchrotron X-Ray Diffraction

J. Bohr, R. Feidenhans’l, M. Nielsen et al. · Physical Review Letters · 1985 · 202 citations

X-ray Crystallography, Engineering, Ii-vi Semiconductor +19