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Defect structure of a free standing GaN wafer grown by the ammonothermal method

Materials ScienceWide-bandgap SemiconductorSemiconductor TechnologyEngineeringApplied PhysicsAluminum Gallium NitrideAmmonothermal MethodGan Power DeviceDefect StructureCategoryiii-v SemiconductorFree Standing GanOptoelectronics