Density of states in the channel material of low temperature polycrystalline silicon thin film transistors

Conductivity behavior in polycrystalline semiconductor thin film transistors

J. Levinson, F. R. Shepherd, P. J. Scanlon et al. · Journal of Applied Physics · 1982 · 615 citations

Engineering, Electrical Engineering, Materials Science +17

Determination of gap state density in polycrystalline silicon by field-effect conductance

G. Fortunato, P. Migliorato · Applied Physics Letters · 1986 · 182 citations

Engineering, Materials Science, Physics +17

Theoretical Interpretations of the Gap State Density Determined from the Field Effect and Capacitance-Voltage Characteristics of Amorphous Semiconductors

T. Suzuki, Yukio Ôsaka, Masataka Hirose · Japanese Journal of Applied Physics · 1982 · 63 citations

Natural Sciences, Materials Science, Physics +17

Applications of the Modulated Photocurrent Technique to the Determination of Gap States Characteristics in Hydrogenated Amorphous Silicon

Jean‐Paul Kleider, Christophe Longeaud · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1995 · 47 citations

Natural Sciences, Materials Engineering, Materials Science +16

Performance of thin film Transistors on Unhydrogenated <i>In-Situ</i> Doped Polysilicon films Obtained by Solid Phase Crystallization

K. Mourgues, F. Raoult, Laurent Pichon et al. · MRS Proceedings · 1997 · 21 citations

Engineering, Materials Engineering, Materials Science +14