Density of states in the channel material of low temperature polycrystalline silicon thin film transistors - Concepedia

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Density of states in the channel material of low temperature polycrystalline silicon thin film transistors

11

Citations

8

References

2000

Year

K. Mourgues, A. Rahal, T. Mohammed-Brahim, M. Sarret, Jean‐Paul Kleider, Christophe Longeaud, A. Bachrouri, A. Romano‐Rodrı́guez

Journal of Non-Crystalline Solids

Electrical EngineeringSemiconductor DeviceEngineeringApplied PhysicsSemiconductor Device FabricationSilicon On InsulatorChannel MaterialThin Film Processing

References

	Year	Citations

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