Publication | Closed Access
Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin films
182
Citations
25
References
2012
Year
Materials ScienceLayer ThicknessFerroelasticsFerroelectric BehaviourEngineeringFerroelectric ApplicationOxide ElectronicsApplied PhysicsThin FilmsThin Film Processing
| Year | Citations | |
|---|---|---|
2011 | 2.6K | |
2006 | 1.8K | |
2012 | 816 | |
2011 | 669 | |
1992 | 578 | |
2011 | 565 | |
2003 | 307 | |
1963 | 265 | |
1949 | 258 | |
2005 | 257 |
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