Concepedia

Aging-Aware Power or Frequency Tuning With Predictive Fault Detection

Jackson Pachito, C. V. Martins, Bruno Jacinto, J. Semião, J. C. Vazquez, Victor Champac, Marcelino Santos, I.C. Teixeira, J.P. Teixeira

IEEE Design & Test of Computers · 2012 · 17 citations · 10 references

Abstract

This paper presents a methodology to use global and local performance sensors, allowing the circuits to be optimized for power and/or performance.

References

10

A comprehensive model of PMOS NBTI degradation

Md Ashraful Alam, Souvik Mahapatra · Microelectronics Reliability · 2004 · 750 citations

Device Modeling, Electrical Engineering, Engineering +4

Circuit Failure Prediction and Its Application to Transistor Aging

Mridul Agarwal, Bipul C. Paul, Ming Zhang et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2007 · 444 citations

Engineering, Vlsi Design, Computer Architecture +16

Predictive Modeling of the NBTI Effect for Reliable Design

Sarvesh Bhardwaj, Wenping Wang, Rakesh Vattikonda et al. · 2006 · 430 citations

Device Modeling, Threshold Voltage Change, Electrical Engineering +14

The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis

Wenping Wang, Shengqi Yang, Sarvesh Bhardwaj et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2009 · 280 citations

Engineering, Vlsi Design, Nbti Effect +17

NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?

Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park et al. · Asia and South Pacific Design Automation Conference · 2008 · 77 citations

Non-volatile Memory, Engineering, Computer Architecture +19