IEEE Transactions on Nuclear Science · 1987 · 77 citations · 5 references
EngineeringComputer EngineeringElectrical EngineeringFault ToleranceFault-tolerant ComputingMicroelectronicsBuilt-in Self-testDesign For TestabilityDevice ReliabilityHardware Fault ToleranceLaser PhysicsSemiconductor ReliabilityBipolar Circuit DesignCircuit Response AnalysisHardware Fault ModelsRadiation Effects On ReliabilitySensitivitySingle Event EffectsSingle Event Upset ModelingSoft Error Detection
A pulsed picosecond laser was used to produce upsets in both a commercial bipolar logic circuit and a specially designed CMOS SRAM test structure. Comparing the laser energy necessary for producing upsets in transistors that have different upset sensitivities with the single event upset (SEU) level predicted from circuit analysis showed that a picosecond laser could measure circuit sensitivity to SEUs. The technique makes it possible not only to test circuits rapidly for upset sensitivity but also, because the beam can be focussed down to a small spot size, to identify sensitive transistors.
5
Optical Constants of Silicon in the Region 1 to 10 ev
H. R. Philipp, E. A. Taft · Physical Review · 1960 · 562 citations
Single Event Error Immune CMOS RAM
Justin L. Andrews, John Schroeder, B. L. Gingerich et al. · IEEE Transactions on Nuclear Science · 1982 · 71 citations
Engineering, Computer Engineering, Electrical Engineering +13