2012 · 18 citations · 2 references
EngineeringComputer EngineeringElectrical EngineeringInstrumentationMicroelectronicsSystem-on-chip DesignBuilt-in Self-testDesign For TestabilityDevice CharacterizationElectrical MeasurementTemperature MeasurementAccuracyElectrical TestabilityOn-chip InstrumentationOn-wafer Measurement TechniquesTemperature-dependent Electrical MeasurementsThermal Test InstrumentationVoltage MeasurementVoltage Measurement Circuits
This paper proposes a novel technique to measure temperature and voltage on-chip in field test. It consists of three types of NBTI-tolerant ring oscillator and counters constructed with a standard cell library. Temperature and voltage are estimated with high accuracy and in a short time.
2
A circuit failure prediction mechanism (DART) for high field reliability
Yasuo Satô, Seiji Kajihara, Yukiya Miura et al. · 2009 · 31 citations
Engineering, Computer Engineering, Electrical Engineering +14