Statistics
Publications
7
Citations
144
H-Index
7
Active since
2000
Yukiya Miura is an author at Tokyo Metropolitan University specializing in electrical engineering, computer engineering, and engineering.
Publications per year
2000–2016
7
7
A circuit failure prediction mechanism (DART) for high field reliability
Yasuo Satô, Seiji Kajihara, Yukiya Miura et al. · 2009 · 31 citations
Engineering, Computer Engineering, Electrical Engineering +14
On estimation of NBTI-Induced delay degradation
Mitsumasa Noda, Seiji Kajihara, Yasuo Satô et al. · 2010 · 29 citations
Engineering, Computer Engineering, Electrical Engineering +17
DART: Dependable VLSI test architecture and its implementation
Yasuo Satô, Seiji Kajihara, Tomokazu Yoneda et al. · 2012 · 26 citations · Full text
Engineering, Computer Engineering, Electrical Engineering +17
On-chip temperature and voltage measurement for field testing
Yukiya Miura, Yasuo Satô, Y. Miyake et al. · 2012 · 18 citations
Engineering, Computer Engineering, Electrical Engineering +16
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