Statistics
Publications
1
Citations
29
H-Index
1
Active since
2010
Affiliations
Tokyo Metropolitan University(Current)
Mitsumasa Noda is an author at Tokyo Metropolitan University specializing in delay fault testing, aging, and semiconductor reliability.
Publications per year
2010–2010
1
1
On estimation of NBTI-Induced delay degradation
Mitsumasa Noda, Seiji Kajihara, Yasuo Satô et al. · 2010 · 29 citations
Engineering, Computer Engineering, Electrical Engineering +17
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