Tomokazu Yoneda

Partial Scan Approach for Secret Information Protection

Michiko Inoue, Tomokazu Yoneda, Muneo Hasegawa et al. · 2009 · 39 citations

Hardware Trojan, Engineering, Information Security +19

An efficient scan tree design for test time reduction

Yannick Bonhomme, Tomokazu Yoneda, Hideo Fujiwara et al. · 2004 · 38 citations

Engineering, Computer Architecture, Software Engineering +20

A memory grouping method for sharing memory BIST logic

Masahide Miyazaki, Tomokazu Yoneda, Hideo Fujiwara · 2006 · 32 citations

Hardware Security, System On Chip, Memory Bist Logic +14

A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation

Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama et al. · 2012 · 32 citations

Engineering, Vlsi Design, Measurement +18

A circuit failure prediction mechanism (DART) for high field reliability

Yasuo Satô, Seiji Kajihara, Yukiya Miura et al. · 2009 · 31 citations

Reliability, Electrical Engineering, Reliability Engineering +13