Kazumi Hatayama

A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation

Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama et al. · 2012 · 32 citations

Engineering, Vlsi Design, Measurement +18

A Capture-Safe Test Generation Scheme for At-Speed Scan Testing

Xiaoqing Wen, Kohei Miyase, Seiji Kajihara et al. · 2008 · 32 citations

Engineering, Capture Ir-drop, Mem Testing +18

Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-Identification

Kohei Miyase, K. Noda, Hideaki Ito et al. · 2008 · 24 citations

A Variability-Aware Adaptive Test Flow for Test Quality Improvement

Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2014 · 22 citations

Engineering, Mem Testing, Computer Architecture +19

Sequential test generation based on real-valued logic simulation

Kazumi Hatayama, Kazunori Hikone, Mitsuji Ikeda et al. · 1992 · 21 citations

Engineering, Verification, Computer Architecture +22