High brightness GaN LEDs degradation during dc and pulsed stress

Solid-state lighting: failure analysis of white LEDs

Nadarajah Narendran, Yimin Gu, J. P. Freyssinier et al. · Journal of Crystal Growth · 2004 · 576 citations

Architecture, Electrical Engineering, Materials Science +14

Junction–temperature measurement in GaN ultraviolet light-emitting diodes using diode forward voltage method

Y. Xi, E. Fred Schubert · Applied Physics Letters · 2004 · 412 citations

Engineering, Electrical Engineering, Materials Science +17

Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses

X. A. Cao, Peter M. Sandvik, S. F. LeBoeuf et al. · Microelectronics Reliability · 2003 · 143 citations

Engineering, Materials Engineering, Materials Science +16

Influence of short-term low current dc aging on the electrical and optical properties of InGaN blue light-emitting diodes

Francesca Rossi, M. Pavesi, Matteo Meneghini et al. · Journal of Applied Physics · 2006 · 87 citations

Engineering, Electrical Engineering, Materials Science +17

Single-quantum well InGaN green light emitting diode degradation under high electrical stress

Daniel L. Barton, Marek Osiński, P. Perlin et al. · Microelectronics Reliability · 1999 · 61 citations

Engineering, Electrical Engineering, Materials Science +16