Concepedia

Publication | Closed Access

High brightness GaN LEDs degradation during dc and pulsed stress

DOI

49

Citations

8

References

2006

Year

Matteo Meneghini, S. Podda, Alessio Morelli, Ruggero Pintus, Lorenzo Roberto Trevisanello, Gaudenzio Meneghesso, M. Vanzi, Enrico Zanoni
Microelectronics Reliability

References

YearCitations

Page 1