Y. Xi

Junction–temperature measurement in GaN ultraviolet light-emitting diodes using diode forward voltage method

Y. Xi, E. Fred Schubert · Applied Physics Letters · 2004 · 411 citations

Wide-bandgap Semiconductor, Electrical Engineering, Solid-state Lighting +13

Influence of junction temperature on chromaticity and color-rendering properties of trichromatic white-light sources based on light-emitting diodes

Sameer Chhajed, Y. Xi, Y.-L. Li et al. · Journal of Applied Physics · 2005 · 301 citations

Luminous Efficacy, Photonics, Electrical Engineering +14

Junction and carrier temperature measurements in deep-ultraviolet light-emitting diodes using three different methods

Y. Xi, Jingtian Xi, Th. Gessmann et al. · Applied Physics Letters · 2005 · 197 citations · Full text

Wide-bandgap Semiconductor, Engineering, Junction Temperature +17

Junction temperature in light-emitting diodes assessed by different methods

Sameer Chhajed, Y. Xi, Thomas Gessmann et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005 · 98 citations

Junction Temperature in Ultraviolet Light-Emitting Diodes

Y. Xi, Thomas Gessmann, Jingqun Xi et al. · Japanese Journal of Applied Physics · 2005 · 88 citations

Semiconductors, Electrical Engineering, Electronic Devices +13