Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses - Concepedia

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Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses

143

Citations

12

References

2003

Year

X. A. Cao, Peter M. Sandvik, S. F. LeBoeuf, S. D. Arthur

Microelectronics Reliability

Wide-bandgap SemiconductorElectrical EngineeringDefect GenerationEngineeringSolid-state LightingApplied PhysicsAluminum Gallium NitrideIngan/gan Light-emitting DiodesGan Power DeviceOptoelectronicsElectrical Stresses

References

	Year	Citations

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