S. D. Arthur

Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses

X. A. Cao, Peter M. Sandvik, S. F. LeBoeuf et al. · Microelectronics Reliability · 2003 · 143 citations

Engineering, Materials Engineering, Materials Science +16

High-power and reliable operation of vertical light-emitting diodes on bulk GaN

X. A. Cao, S. D. Arthur · Applied Physics Letters · 2004 · 132 citations

Engineering, Electrical Engineering, Materials Science +17

Microstructural origin of leakage current in GaN/InGaN light-emitting diodes

X. A. Cao, Julie Teetsov, F. Shahedipour‐Sandvik et al. · Journal of Crystal Growth · 2004 · 121 citations

Engineering, Electrical Engineering, Materials Science +14

Blue and near-ultraviolet light-emitting diodes on free-standing GaN substrates

X. A. Cao, S. F. LeBoeuf, Mark P. D’Evelyn et al. · Applied Physics Letters · 2004 · 98 citations

Engineering, Electrical Engineering, Materials Science +17

Recent advances in silicon carbide MOSFET power devices

Ljubisa Stevanovic, Kevin Matocha, Peter A. Losee et al. · 2010 · 95 citations

Engineering, Electrical Engineering, Microelectronics +16