M. Vanzi

A physically based mobility model for numerical simulation of nonplanar devices

C. Lombardi, Stefano Manzini, Antonio Saporito et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988 · 802 citations

Engineering, Semiempirical Model, Computer-aided Design +26

Electron Holographic Observations of the Electrostatic Field Associated with Thin Reverse-Biased<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>p</mml:mi><mml:mo>−</mml:mo><mml:mi>n</mml:mi></mml:math>Junctions

Stefano Frabboni, Gioṙgio Matteucci, Giulio Pozzi et al. · Physical Review Letters · 1985 · 163 citations

Charge Excitations, Engineering, Microscopy +20

Accelerated Life Test of High Brightness Light Emitting Diodes

Lorenzo Roberto Trevisanello, Matteo Meneghini, G. Mura et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 161 citations

White Oled, Electrical Engineering, Solid-state Lighting +13

High temperature electro-optical degradation of InGaN/GaN HBLEDs

Matteo Meneghini, Lorenzo Roberto Trevisanello, Carla Sanna et al. · Microelectronics Reliability · 2007 · 79 citations

Electrical Engineering, Engineering, Applied Physics +5

Electron holography of long-range electric and magnetic fields

Giorgio Matteucci, G.F. Missiroli, E. Nichelatti et al. · Journal of Applied Physics · 1991 · 78 citations

Electron Holography, Holography, Engineering +14