Electron Holographic Observations of the Electrostatic Field Associated with Thin Reverse-Biased<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>p</mml:mi><mml:mo>−</mml:mo><mml:mi>n</mml:mi></mml:math>Junctions

Abstract

A new method has been devised for investigation by transmission electron microscopy of the electrostatic microfield associated with reverse biased $p\ensuremath{-}n$ junctions. By means of electron holography and optical interferometry it is possible to obtain on the reconstructed images two-dimensional representations of the projected potential distribution inside and outside the specimen.