High performance 0.25 μm SiGe and SiGe:C HBTs using non selective epitaxy

H. Baudry, B. Martinet, C. Fellous, O. Kermarrec, Y. Campidelli, M. Laurens, M. Marty, J Mourier, G. Troillard, A. Monroy,

2002 · 41 citations · 1 references

Concepts

Abstract

A robust 0.25 /spl mu/m double-poly SiGe HBT structure using non selective epitaxy has been developed. The device features 70/90 GHz f/sub T//f/sub max/ with pure SiGe base in 0.25 /spl mu/m BiCMOS technology. Performances up to 120/100 GHz f/sub T//f/sub max/ are demonstrated for SiGe:C base transistors.

References

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