Applied Physics Letters · 1998 · 10 citations · 8 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDopingSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor SurfacesSurface OxidationThin Film OxidationLow-temperature GrowthOxidationOxidation Defect FormationOxidation KineticsOxidation MechanismsSemiconductor OxidationThermal OxidationWet Oxidation
The effects of incorporating low-temperature-grown GaAs (LT GaAs) into the layer structure of Al0.98Ga0.02As/GaAs are studied. Results show that the structures containing a 300 nm layer of LT GaAs have faster oxidation rates and lower oxidation temperatures compared to reference samples without the LT GaAs layer. This letter will discuss the mechanisms involved in the oxidation rate increase, attributed to the LT GaAs enhancing the transport of As species during the oxidation process.
8
Selective oxidation of buried AlGaAs versus AlAs layers
Kent D. Choquette, K.M. Geib, H. C. Chui et al. · Applied Physics Letters · 1996 · 85 citations
Natural Sciences, Materials Engineering, Materials Science +17