Corrected Electron Optical Systems (Germany)

Institution (Company)

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Corrected Electron Optical Systems (Germany) · Acronym: CEOS

201

Publications

10.3K

Citations

Authors

Concepts

About

Corrected Electron Optical Systems (Germany) is a company institution in Heidelberg, Germany known for engineering, applied physics, and microscopy.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	20	71	6.2K
2	Medicine	8	24	2.3K
3	Language Studies	2	2	26
4	Education	1	5	515
5	Health Sciences	1	1	60

Corrected Electron Optical Systems (Germany)

201

Publications

10.3K

Citations

Page 1

	Year	Citations
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit C. Kisielowski, Bert Freitag, Maarten Bischoff, Microscopy and Microanalysis EngineeringMicroscopyThree DimensionsElectron DiffractionElectron Microscopy	2008	301
Transmission electron microscopy at 20kV for imaging and spectroscopy Ute Kaiser, Johannes Biskupek, Jannik C. Meyer, Ultramicroscopy Electron MicroscopyMicroscopySpectroscopyApplied PhysicsElectron Microscope	2011	201
Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope Maximilian Haider, H. Rose, Stephan Uhlemann, Journal of Electron Microscopy EngineeringElectron-beam LithographyMicroscopyElectron OpticBeam Optic	1998	193
Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM M. Haider, Stephan Uhlemann, J. Żach Ultramicroscopy Adaptive OpticEngineeringHigh-resolution Aberration-corrected StemOphthalmologyMicroscopy	2000	174
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV Martin Linck, Peter Hartel, Stephan Uhlemann, Physical Review Letters	2016	135
First application of Cc-corrected imaging for high-resolution and energy-filtered TEM B. Kabius, Peter Hartel, M. Haider, Journal of Electron Microscopy High ResolutionEngineeringMicroscopyAdvanced ImagingElectron Diffraction	2009	132
Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration M. Haider, Peter Hartel, Heiko Müller, Microscopy and Microanalysis	2010	114
Advancing the Hexapole <i>C</i><sub><i>s</i></sub>-Corrector for the Scanning Transmission Electron Microscope Heiko Müller, Stephan Uhlemann, Peter Hartel, Microscopy and Microanalysis EngineeringElectron MicroscopyPhysicsMicroscopyMicroscopy Method	2006	113
Thermal Magnetic Field Noise Limits Resolution in Transmission Electron Microscopy Stephan Uhlemann, Heiko Müller, Peter Hartel, Physical Review Letters	2013	109
Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM M. Haider, Heiko Müller, Stephan Uhlemann, Ultramicroscopy High ResolutionEngineeringMeasurementCalibrationCc/cs-corrected Ultrahigh-resolution Tem	2007	103

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