J. Żach

JŻ

Statistics

Publications

Citations

673

H-Index

Active since

1986

Affiliations

Corrected Electron Optical Systems (Germany)(Current)

J. Żach is an author at Corrected Electron Optical Systems (Germany) specializing in physics, electron microscopy, and transmission electron microscopy.

ORCID

Publications per year

1986–2019

Publications

Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM

M. Haider, Stephan Uhlemann, J. Żach · Ultramicroscopy · 2000 · 174 citations

Natural Sciences, Physics, Optics +7

First application of Cc-corrected imaging for high-resolution and energy-filtered TEM

B. Kabius, Peter Hartel, M. Haider et al. · Journal of Electron Microscopy · 2009 · 132 citations

Natural Sciences, Materials Science, Physics +14

Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration

M. Haider, Peter Hartel, Heiko Müller et al. · Microscopy and Microanalysis · 2010 · 114 citations

Medicine, Physics, Contrast Sensitivity +15

Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM

M. Haider, Heiko Müller, Stephan Uhlemann et al. · Ultramicroscopy · 2007 · 103 citations

Engineering, Materials Science, Metrology +1

Current and future aberration correctors for the improvement of resolution in electron microscopy

M. Haider, Peter Hartel, Heiko Müller et al. · Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences · 2009 · 80 citations

Medicine, Physics, Biomedical Optics +16

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