Stephan Uhlemann

Electron microscopy image enhanced

Maximilian Haider, Stephan Uhlemann, Eugen Schwan et al. · Nature · 1998 · 1K citations

Engineering, Electron Microscopy, Microscopy +7

A spherical-aberration-corrected 200kV transmission electron microscope

Max Haider, Harald Rose, Stephan Uhlemann et al. · Ultramicroscopy · 1998 · 419 citations

Electron Microscopy, Microscopy, Applied Physics +3

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

C. Kisielowski, Bert Freitag, Maarten Bischoff et al. · Microscopy and Microanalysis · 2008 · 301 citations

Engineering, Microscopy, Three Dimensions +20

Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope

Maximilian Haider, H. Rose, Stephan Uhlemann et al. · Journal of Electron Microscopy · 1998 · 193 citations

Engineering, Electron-beam Lithography, Microscopy +21

Residual wave aberrations in the first spherical aberration corrected transmission electron microscope

Stephan Uhlemann, Maximilian Haider · Ultramicroscopy · 1998 · 177 citations

First Spherical Aberration, Optical Materials, Engineering +13