H. Rose - Concepedia

Author

H. Rose

Darmstadt University of Applied Sciences

Also Known As

G Longman, H Rose, H. ROSE, H. Rose, Hozen Ricchie Rose

Publications

3.1K

Citations

H-Index

Concepts

All Affiliations

Darmstadt University of Applied Sciences Technical University of Darmstadt Institut für Technische und Angewandte Physik (Germany)Fritz Haber Institute of the Max Planck Society University of Würzburg

About

H. Rose is an author at Darmstadt University of Applied Sciences specializing in engineering, microscopy, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	21	24	1.6K
2	Applied Physics	18	21	1.3K
3	Medicine	6	6	450
4	Natural Sciences	6	6	461
5	Health Sciences	4	4	526

H. Rose

Publications

2.6K

Citations

H-Index

Page 1

	Year	Citations
Conditions and reasons for incoherent imaging in STEM Peter Hartel, H. Rose, C. Dinges Ultramicroscopy EngineeringMedical ImagingAdvanced ImagingBiomedical ImagingIncoherent Imaging	1996	395
Nonstandard imaging methods in electron microscopy H. Rose Ultramicroscopy Electron MicroscopyMicroscopy MethodMicroscopyBiomedical ImagingElectron Microscope	1976	248
Transmission electron microscopy at 20kV for imaging and spectroscopy Ute Kaiser, Johannes Biskupek, Jannik C. Meyer, Ultramicroscopy Electron MicroscopyMicroscopySpectroscopyApplied PhysicsElectron Microscope	2011	201
Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope Maximilian Haider, H. Rose, Stephan Uhlemann, Journal of Electron Microscopy EngineeringElectron-beam LithographyMicroscopyElectron OpticBeam Optic	1998	193
SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II R. Fink, M. Weiss, E. Umbach, Journal of Electron Spectroscopy and Related Phenomena Analytical InstrumentationSpectroscopyBessy IiInstrumentationSpectroscopic Method	1997	154
First application of Cc-corrected imaging for high-resolution and energy-filtered TEM B. Kabius, Peter Hartel, M. Haider, Journal of Electron Microscopy High ResolutionEngineeringMicroscopyAdvanced ImagingElectron Diffraction	2009	132
XPEEM WITH ENERGY-FILTERING: ADVANTAGES AND FIRST RESULTS FROM THE SMART PROJECT Thomas Schmidt, U. Groh, R. Fink, Surface Review and Letters EngineeringEnergy EfficiencyMicroscopyElectron DiffractionEnergy Management System	2002	96
Double aberration correction in a low-energy electron microscope Thomas Schmidt, Helder Marchetto, Pierre L. Lévesque, Ultramicroscopy Electron MicroscopyPhysicsMicroscopyApplied PhysicsElectron Microscope	2010	88
SMART: An Aberration-Corrected XPEEM/LEEM with Energy Filter R. Wichtendahl, R. Fink, H. Kuhlenbeck, Surface Review and Letters X-ray SpectroscopyEngineeringMeasurementMicroscopyBessy Ii	1998	86
Correction of aperture aberrations in magnetic systems with threefold symmetry H. Rose Nuclear Instruments and Methods in Physics Research Adaptive OpticMagnetismEngineeringPhysicsGeometrical Optic	1981	82

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