Peter Hartel

Conditions and reasons for incoherent imaging in STEM

Peter Hartel, H. Rose, C. Dinges · Ultramicroscopy · 1996 · 401 citations

Engineering, Biomedical Engineering, Biomedical Imaging +2

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

C. Kisielowski, Bert Freitag, Maarten Bischoff et al. · Microscopy and Microanalysis · 2008 · 307 citations

Natural Sciences, Materials Science, Physics +16

Transmission electron microscopy at 20kV for imaging and spectroscopy

Ute Kaiser, Johannes Biskupek, Jannik C. Meyer et al. · Ultramicroscopy · 2011 · 201 citations

Natural Sciences, Materials Science, Physics +4

SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II

R. Fink, M. Weiss, E. Umbach et al. · Journal of Electron Spectroscopy and Related Phenomena · 1997 · 154 citations

Natural Sciences, Chemistry, Analytical Chemistry +6

Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV

Martin Linck, Peter Hartel, Stephan Uhlemann et al. · Physical Review Letters · 2016 · 137 citations

Natural Sciences, Materials Science, Physics +16