Maarten Bischoff

Single-particle cryo-EM at atomic resolution

Takanori Nakane, Abhay Kotecha, Andrija Sente et al. · Nature · 2020 · 862 citations · Full text

Engineering, Physics, Cryogenics +3

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

C. Kisielowski, Bert Freitag, Maarten Bischoff et al. · Microscopy and Microanalysis · 2008 · 301 citations

Engineering, Microscopy, Three Dimensions +20

Domain (Grain) Boundaries and Evidence of “Twinlike” Structures in Chemically Vapor Deposited Grown Graphene

Jinho An, Edgar Voelkl, Ji Won Suk et al. · ACS Nano · 2011 · 180 citations

Materials Science, Graphene Nanomeshes, Graphene-based Nano-antennas +14

Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV

Martin Linck, Peter Hartel, Stephan Uhlemann et al. · Physical Review Letters · 2016 · 135 citations

Observation of Spin-Polarized Surface States on Ultrathin bct Mn(001) Films by Spin-Polarized Scanning Tunneling Spectroscopy

Toyo Kazu Yamada, Maarten Bischoff, G. M. M. Heijnen et al. · Physical Review Letters · 2003 · 105 citations

Engineering, Spin-polarized Surface States, Ultrathin Bct Mn +20