Concepedia

Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM

M. Haider, Stephan Uhlemann, J. Żach

Ultramicroscopy · 2000 · 174 citations · 8 references

DOI

Concepts

References

8

Towards sub-Å electron beams

Ondrej L. Krivanek, Niklas Dellby, Andrew R. Lupini · Ultramicroscopy · 1999 · 604 citations

, , +7

A spherical-aberration-corrected 200kV transmission electron microscope

Max Haider, Harald Rose, Stephan Uhlemann et al. · Ultramicroscopy · 1998 · 422 citations

, , +9

XV.<i>On the theory of optical images, with special reference to the microscope</i>

Rayleigh · The London Edinburgh and Dublin Philosophical Magazine and Journal of Science · 1896 · 357 citations · Full text

, , +14

Residual wave aberrations in the first spherical aberration corrected transmission electron microscope

Stephan Uhlemann, Maximilian Haider · Ultramicroscopy · 1998 · 178 citations

, , +13

Aberration correction in a low voltage SEM by a multipole corrector

Joachim Zach, Maximilian Haider · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1995 · 150 citations

, , +10