M. Haider

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

C. Kisielowski, Bert Freitag, Maarten Bischoff et al. · Microscopy and Microanalysis · 2008 · 301 citations

Engineering, Microscopy, Three Dimensions +20

Transmission electron microscopy at 20kV for imaging and spectroscopy

Ute Kaiser, Johannes Biskupek, Jannik C. Meyer et al. · Ultramicroscopy · 2011 · 201 citations

Electron Microscopy, Microscopy, Spectroscopy +2

Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM

M. Haider, Stephan Uhlemann, J. Żach · Ultramicroscopy · 2000 · 174 citations

Adaptive Optic, Engineering, High-resolution Aberration-corrected Stem +11

First application of Cc-corrected imaging for high-resolution and energy-filtered TEM

B. Kabius, Peter Hartel, M. Haider et al. · Journal of Electron Microscopy · 2009 · 132 citations

High Resolution, Engineering, Microscopy +21

Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration

M. Haider, Peter Hartel, Heiko Müller et al. · Microscopy and Microanalysis · 2010 · 114 citations