Heiko Müller

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

C. Kisielowski, Bert Freitag, Maarten Bischoff et al. · Microscopy and Microanalysis · 2008 · 301 citations

Engineering, Microscopy, Three Dimensions +20

Transmission electron microscopy at 20kV for imaging and spectroscopy

Ute Kaiser, Johannes Biskupek, Jannik C. Meyer et al. · Ultramicroscopy · 2011 · 201 citations

Electron Microscopy, Microscopy, Spectroscopy +2

Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV

Martin Linck, Peter Hartel, Stephan Uhlemann et al. · Physical Review Letters · 2016 · 135 citations

Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration

M. Haider, Peter Hartel, Heiko Müller et al. · Microscopy and Microanalysis · 2010 · 114 citations

Advancing the Hexapole <i>C</i>_<i>s</i>-Corrector for the Scanning Transmission Electron Microscope

Heiko Müller, Stephan Uhlemann, Peter Hartel et al. · Microscopy and Microanalysis · 2006 · 113 citations

Engineering, Electron Microscopy, Physics +12