Aberration Corrections
Aberration Corrections is a computational method in optical instrumentation that systematically compensates for distortions in wavefront propagation caused by imperfections in optical systems or atmospheric interference, thereby enhancing the accuracy of spatial and temporal measurements in fields such as confocal microscopy, multiphoton microscopy, astrometry, and X-ray optics.
909
Publications
44.4K
Citations
2.9K
Authors
798
Institutions
Publications per year
2017–2026
184
909
The Theoretical Resolution Limit of the Electron Microscope
Otto Scherzer · Journal of Applied Physics · 1949 · 916 citations
Sub-ångstrom resolution using aberration corrected electron optics
Philip E. Batson, Niklas Dellby, Ondrej L. Krivanek · Nature · 2002 · 899 citations
Grain Boundary Mapping in Polycrystalline Graphene
Kwanpyo Kim, Zonghoon Lee, William Regan et al. · ACS Nano · 2011 · 636 citations
1–5 of 909
2.9K
17
h-index
12
h-index
11
h-index
10
h-index
10
h-index
1–5 of 2.9K
798
University of Oxford
Oxford, United Kingdom
27 h-index
122 publications
9.7K citations

Oak Ridge National Laboratory
Oak Ridge, United States
20 h-index
69 publications
5.4K citations

Centre National de la Recherche Scientifique
Paris, France
19 h-index
70 publications
2.3K citations
Stanford University
Stanford, United States
15 h-index
37 publications
1.8K citations

University of Rochester
Rochester, United States
15 h-index
40 publications
3.1K citations

Lawrence Berkeley National Laboratory
Berkeley, United States
14 h-index
35 publications
2.2K citations

Chinese Academy of Sciences
Beijing, China
14 h-index
79 publications
1.7K citations
Duke University
Durham, United States
14 h-index
43 publications
2.8K citations
1–8 of 798
74 publications · 3.8K citations
33
h-index
51 publications · 2.6K citations
28
h-index
44 publications · 2.2K citations
26
h-index
61 publications · 2.9K citations
25
h-index
30 publications · 2.2K citations
22
h-index
1–5