Test Compression

Test Compression is a design for testability technique that reduces the volume of test data and test application time by encoding test stimuli and responses using compressed representations, distinguishing itself from conventional testing methods through the application of on-chip decompression and compaction hardware.

346

Publications

14.1K

Citations

733

Authors

264

Institutions

Publications per year

2017–2026

Parents

Design For Testability

Publications

346

Embedded Deterministic Test

Janusz Rajski, Jerzy Tyszer, Mark Kassab et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2004 · 526 citations

Engineering, Computer Engineering, Computer Science +13

Survey of Test Vector Compression Techniques

Nur A. Touba · IEEE Design & Test of Computers · 2006 · 440 citations

Computing, Computer Engineering, Computer Science +11

System-on-a-chip test-data compression and decompression architectures based on Golomb codes

Anshuman Chandra, Krishnendu Chakrabarty · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2001 · 366 citations

Engineering, Computer Engineering, Computer Science +16

OPMISR: the foundation for compressed ATPG vectors

C. Barnhart, V. Brunkhorst, F. Distler et al. · 2002 · 344 citations

Engineering, Computer Engineering, Electrical Engineering +14

An efficient test vector compression scheme using selective huffman coding

Abhijit Jas, J. Ghosh-Dastidar, Mom-Eng Ng et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2003 · 277 citations

Engineering, Computer Engineering, Computer Science +14

1–5 of 346

Authors

733

KC
Krishnendu Chakrabarty
Duke University, United States
34 publications · 2.2K citations
24
h-index
JR
Janusz Rajski
Mentor Technologies, United States
28 publications · 1.5K citations
20
h-index
JT
Jerzy Tyszer
Poznań University of Technology, Poland
27 publications · 1.4K citations
19
h-index
NM
Nilanjan Mukherjee
Mentor Technologies, United States
17 publications · 1K citations
16
h-index
NA
Nur A. Touba
The University of Texas at Austin, United States
16 publications · 1.5K citations
14
h-index

1–5 of 733

Institutions

264

1–8 of 264

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
38 publications · 2.4K citations
23
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
16 publications · 561 citations
14
h-index
IEEE Transactions on Computers
9 publications · 727 citations
9
h-index
IEEE Design & Test of Computers
8 publications · 686 citations
8
h-index
Proceedings - ACM IEEE Design Automation Conference
4 publications · 176 citations
4
h-index

1–5