Concepedia

Pseudo-random Pattern Generation

Pseudo-Random Pattern Generation is a method in built-in self-test systems that generates test patterns using deterministic algorithms to approximate randomness, enabling efficient and repeatable fault detection in digital circuits.

348

Publications

14.4K

Citations

816

Authors

312

Institutions

Publications per year

2017–2026

73

Variants

Prpg

Parents

Publications

348

Built-in test for VLSI: Pseudorandom techniques

Integration · 1989 · 866 citations

, , +12

Built-in test for VLSI — pseudorandom techniques

Colin Maunder · Microprocessors and Microsystems · 1989 · 639 citations

, , +13

Built-In Self-Test Techniques

Edward R. McCluskey · IEEE Design & Test of Computers · 1985 · 422 citations

, , +16

Cellular automata-based pseudorandom number generators for built-in self-test

P.D. Hortensius, R.D. McLeod, W. Pries et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1989 · 349 citations

, , +17

Broad-side delay test

J. Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1994 · 255 citations

, , +14

1–5 of 348

Authors

816

  1. EM
    E.J. McCluskey

    Stanford University, United States

    11 publications · 474 citations

    10

    h-index

  2. JR
    Janusz Rajski

    Mentor Technologies, United States

    9 publications · 469 citations

    9

    h-index

  3. JT
    Jerzy Tyszer

    Poznań University of Technology, Poland

    9 publications · 451 citations

    9

    h-index

  4. GJ
    Gert Jervan

    Tallinn University of Technology, Estonia

    8 publications · 235 citations

    8

    h-index

  5. CL
    C. Landrault

    Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France

    7 publications · 163 citations

    7

    h-index

1–5 of 816

Institutions

312

  1. Stanford University

    Stanford, United States

    15 h-index

    35 publications

    2.4K citations

  2. Centre National de la Recherche Scientifique

    Paris, France

    11 h-index

    35 publications

    906 citations

  3. Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier

    Montpellier, France

    11 h-index

    40 publications

    1K citations

  4. Mentor Technologies

    Tulsa, United States

    11 h-index

    24 publications

    932 citations

  5. IBM (United States)

    Armonk, United States

    11 h-index

    16 publications

    1.1K citations

  6. Poznań University of Technology

    Poznan, Poland

    8 h-index

    12 publications

    470 citations

  7. University of Iowa

    Iowa City, United States

    7 h-index

    13 publications

    450 citations

  8. Linköping University

    Linköping, Sweden

    7 h-index

    19 publications

    463 citations

1–8 of 312

Venues

  1. 19

    h-index

  2. IEEE Transactions on Computers

    13 publications · 786 citations

    12

    h-index

  3. Journal of Electronic Testing

    JETTA · 8 publications · 238 citations

    8

    h-index

  4. IEEE Access

    8 publications · 206 citations

    8

    h-index

  5. Electronics Letters

    5 publications · 81 citations

    5

    h-index

1–5