Process Control Metrology

Process Control Metrology is a metrological framework within microfabrication that systematically characterizes and monitors manufacturing variations during production to ensure process stability and device conformity through real-time measurement and feedback.

62

Publications

2.1K

Citations

247

Authors

66

Institutions

Publications per year

2017–2026

6

Authors

247

  1. FC
    Fan‐Tien Cheng

    National Cheng Kung University, Taiwan

    4 publications · 113 citations

    4

    h-index

  2. NS
    Nobuhiro Shinohara

    Nagaoka University of Technology, Japan

    1 publications · 34 citations

    2

    h-index

  3. YS
    Yu-Chuan Su

    National Tsing Hua University, Taiwan

    2 publications · 72 citations

    2

    h-index

  4. BB
    Benjamin Bunday

    National Institute of Standards and Technology, United States

    2 publications · 40 citations

    2

    h-index

  5. TL
    Tung-Ho Lin

    National Cheng Kung University, Taiwan

    2 publications · 72 citations

    2

    h-index

1–5 of 247