Noise Margin Analysis

Noise Margin Analysis is a metric-based method in electronic circuit design that quantifies the tolerance of a logic circuit to undesired voltage fluctuations by determining the difference between the actual signal levels and the minimum acceptable thresholds for correct logical operation, particularly under near-threshold and subthreshold operating conditions where signal integrity is highly sensitive to process, voltage, and temperature variations.

161

Publications

7.6K

Citations

571

Authors

159

Institutions

Publications per year

2017–2026

Variants

Noise Margin Calculation

Parents

Near-threshold ComputingSignal IntegritySubthreshold Circuit Design

Publications

161

Margin measurements in optical amplifier system

Neal S. Bergano, F.W. Kerfoot, C.R. Davidsion · IEEE Photonics Technology Letters · 1993 · 551 citations

Engineering, Electrical Engineering, Optoelectronics +16

Memristor-based memory: The sneak paths problem and solutions

Mohammed A. Zidan, Hossam A. H. Fahmy, Muhammad M. Hussain et al. · Microelectronics Journal · 2012 · 448 citations

Engineering, Computer Engineering, Electrical Engineering +17

Static Noise Margin Variation for Sub-threshold SRAM in 65-nm CMOS

Benton H. Calhoun, Anantha P. Chandrakasan · IEEE Journal of Solid-State Circuits · 2006 · 344 citations

Engineering, Computer Engineering, Electrical Engineering +17

High-Performance WSe<sub>2</sub>Complementary Metal Oxide Semiconductor Technology and Integrated Circuits

Lili Yu, Ahmad Zubair, Elton J. G. Santos et al. · Nano Letters · 2015 · 252 citations

Engineering, Electrical Engineering, Materials Science +17

Worst-case static noise margin criteria for logic circuits and their mathematical equivalence

J. Lohstroh, E. Seevinck, John de Groot · IEEE Journal of Solid-State Circuits · 1983 · 206 citations

Engineering, Computer Engineering, Electrical Engineering +15

1–5 of 161

Authors

571

SM
Subhasish Mitra
Stanford University, United States
5 publications · 188 citations
5
h-index
TH
Toshiro Hiramoto
The University of Tokyo, Japan
5 publications · 150 citations
5
h-index
SK
Shiro Kamohara
The University of Tokyo, Japan
4 publications · 140 citations
4
h-index
TS
Takuya Saraya
The University of Tokyo, Japan
4 publications · 140 citations
4
h-index
MA
Massimo Alioto
National University of Singapore, Singapore
4 publications · 94 citations
4
h-index

1–5 of 571

Institutions

159

1–8 of 159

Venues

IEEE Transactions on Electron Devices
19 publications · 769 citations
15
h-index
IEEE Journal of Solid-State Circuits
13 publications · 1.1K citations
12
h-index
IEEE Electron Device Letters
10 publications · 573 citations
10
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
5 publications · 287 citations
5
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
4 publications · 163 citations
4
h-index

1–5