J. Lohstroh

Worst-case static noise margin criteria for logic circuits and their mathematical equivalence

J. Lohstroh, E. Seevinck, John de Groot · IEEE Journal of Solid-State Circuits · 1983 · 206 citations

Circuit Complexity, Computational Complexity Theory, Engineering +18

Static and dynamic noise margins of logic circuits

J. Lohstroh · IEEE Journal of Solid-State Circuits · 1979 · 103 citations

Hardware Security, Aeroacoustics, Engineering +13

ISL, a fast and dense low-power logic, made in a standard Schottky process

J. Lohstroh · IEEE Journal of Solid-State Circuits · 1979 · 36 citations

Dense Low-power Logic, Engineering, Vlsi Design +20

Punch-through currents in P+NP+ and N+PN+ sandwich structures—I

J. Lohstroh, J.J.M. Koomen, A.T. Van Zanten et al. · Solid-State Electronics · 1981 · 34 citations

Engineering, Physics, Many-body Problem +3

Devices and circuits for bipolar (V)LSI

J. Lohstroh · Proceedings of the IEEE · 1981 · 28 citations

Electrical Engineering, Engineering, Vlsi Design +13