Micromasking

Micromasking is a thin film etching phenomenon in which microscopic particles or residues act as localized masks during plasma etching, thereby preventing selective removal of underlying material and leading to surface roughness or feature distortions.

27

Publications

911

Citations

113

Authors

55

Institutions

Publications per year

2017–2026

7

Authors

113

  1. YY
    Yunpeng Yin

    IBM (United States), United States

    2 publications · 38 citations

    2

    h-index

  2. AB
    Alvise Bagolini

    Fondazione Bruno Kessler, Italy

    2 publications · 101 citations

    2

    h-index

  3. HH
    Herbert H. Sawin

    Massachusetts Institute of Technology, United States

    2 publications · 38 citations

    2

    h-index

  4. PB
    P. Bellutti

    Fondazione Bruno Kessler, Italy

    2 publications · 101 citations

    2

    h-index

  5. SR
    S. Ronchin

    University of Trento, Italy

    1 publications · 79 citations

    1

    h-index

1–5 of 113

Venues

  1. Journal of Micromechanics and Microengineering

    JMM · 4 publications · 239 citations

    4

    h-index

  2. 4

    h-index

  3. 3

    h-index

  4. Journal of Applied Physics

    2 publications · 41 citations

    2

    h-index

  5. Applied Physics Letters

    2 publications · 111 citations

    2

    h-index

1–5