Mask Characterization

Mask Characterization is a scholarly contribution that constitutes a method, model, framework, theory, construct, dataset, task, or metric specifically advancing the analysis, interpretation, or evaluation of mask-related representations within the field of Mask Work.

17

Publications

484

Citations

66

Authors

19

Institutions

Publications per year

2017–2026

6

Parents

Authors

66

  1. CX
    Chunjie Xu

    Xi'an University of Technology, China

    2 publications · 82 citations

    2

    h-index

  2. YG
    Yuri Granik

    Mentor Technologies, United States

    2 publications · 36 citations

    2

    h-index

  3. ZZ
    Zhongming Zhang

    Huazhong Agricultural University, China

    2 publications · 82 citations

    2

    h-index

  4. XW
    Xiangquan Wu

    Xi’an University, China

    2 publications · 82 citations

    2

    h-index

  5. CP
    Chang-Min Park

    Samsung (South Korea), South Korea

    1 publications · 48 citations

    1

    h-index

1–5 of 66

Venues

  1. 6

    h-index

  2. 3

    h-index

  3. Chemical Engineering Journal

    1 publications · 64 citations

    1

    h-index

  4. Japanese Journal of Applied Physics

    JJAP · 1 publications · 53 citations

    1

    h-index

  5. Huntington Library Quarterly

    1 publications · 29 citations

    1

    h-index

1–5