Mask Characterization
Mask Characterization is a scholarly contribution that constitutes a method, model, framework, theory, construct, dataset, task, or metric specifically advancing the analysis, interpretation, or evaluation of mask-related representations within the field of Mask Work.
17
Publications
484
Citations
66
Authors
19
Institutions
Publications per year
2017–2026
6
Parents
17
1–5 of 17
66
2
h-index
2
h-index
2
h-index
2
h-index
1
h-index
1–5 of 66
19
IMEC
Leuven, Belgium
2 h-index
6 publications
162 citations
Institute of New Materials
Jinan, China
2 h-index
4 publications
164 citations
Xi’an University
Xi'an, China
2 h-index
6 publications
246 citations
Mentor Technologies
Tulsa, United States
2 h-index
5 publications
89 citations
Advanced Mask Technology Center (Germany)
Dresden, Germany
2 h-index
2 publications
21 citations
ASML (Netherlands)
Veldhoven, The Netherlands
2 h-index
3 publications
85 citations
Xi'an University of Technology
Xi'an, China
2 h-index
6 publications
246 citations
Samsung (South Korea)
Seoul, South Korea
1 h-index
17 publications
816 citations
1–8 of 19
6 publications · 149 citations
6
h-index
3 publications · 43 citations
3
h-index
1 publications · 64 citations
1
h-index
JJAP · 1 publications · 53 citations
1
h-index
1 publications · 29 citations
1
h-index
1–5