Concepedia

Interface Trapping Noise

Interface Trapping Noise is a type of low-frequency noise in semiconductor devices arising from the random capture and emission of charge carriers by interface states at the semiconductor-dielectric interface, distinguished from other noise mechanisms by its origin in temporal fluctuations of carrier occupation at localized trap sites near the interface.

45

Publications

1.8K

Citations

191

Authors

76

Institutions

Publications per year

2017–2026

3

Variants

Interface Trap Noise

Parents

Publications

45

Modified 1/f trapping noise theory and experiments in MOS transistors biased from weak to strong inversion—Influence of interface states

G. Reimbold · IEEE Transactions on Electron Devices · 1984 · 330 citations

, , +16

Low-frequency noise in multilayer MoS<sub>2</sub>field-effect transistors: the effect of high-k passivation

Junhong Na, Min‐Kyu Joo, Minju Shin et al. · Nanoscale · 2013 · 174 citations

, , +17

Individual defects at the Si:SiO<sub>2</sub>interface

M. J. Kirton, Michael J. Uren, S. Collins et al. · Semiconductor Science and Technology · 1989 · 117 citations

, , +17

Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET

Ming-Long Fan, Vita Pi‐Ho Hu, Yin-Nein Chen et al. · IEEE Transactions on Electron Devices · 2013 · 76 citations

, , +14

Trap healing and ultralow-noise Hall effect at the surface of organic semiconductors

B. Lee, Y. Chen, Danni Fu et al. · Nature Materials · 2013 · 74 citations

, , +16

1–5 of 45

Authors

191

  1. SD
    Sarit Dhar

    Auburn University, United States

    3 publications · 87 citations

    3

    h-index

  2. BB
    Brinda Bhowmick

    National Institute Of Technology Silchar, India

    3 publications · 149 citations

    3

    h-index

  3. DM
    Daniel M. Fleetwood

    Vanderbilt University, United States

    3 publications · 93 citations

    3

    h-index

  4. RT
    Renan Trevisoli

    Centro Universitário FEI, Brazil

    2 publications · 24 citations

    2

    h-index

  5. AJ
    A. Jeleński

    University of Massachusetts Amherst, United States

    2 publications · 44 citations

    2

    h-index

1–5 of 191

Institutions

76

  1. National Institute Of Technology Silchar

    Silchar, India

    4 h-index

    11 publications

    471 citations

  2. IMEC

    Leuven, Belgium

    3 h-index

    8 publications

    181 citations

  3. Wolfspeed, Inc. (United States)

    Durham, United States

    3 h-index

    7 publications

    187 citations

  4. Centre National de la Recherche Scientifique

    Paris, France

    3 h-index

    7 publications

    210 citations

  5. Centro Universitário FEI

    São Bernardo do Campo, Brazil

    2 h-index

    7 publications

    85 citations

  6. Commissariat à l'Énergie Atomique et aux Énergies Alternatives

    Paris, France

    2 h-index

    4 publications

    69 citations

  7. Yale University

    New Haven, United States

    2 h-index

    4 publications

    144 citations

  8. Korea University

    Seoul, South Korea

    2 h-index

    10 publications

    1.6K citations

1–8 of 76

Venues

  1. IEEE Transactions on Electron Devices

    7 publications · 505 citations

    7

    h-index

  2. Applied Physics Letters

    4 publications · 89 citations

    4

    h-index

  3. IEEE Electron Device Letters

    4 publications · 125 citations

    4

    h-index

  4. Journal of Applied Physics

    3 publications · 140 citations

    3

    h-index

  5. Semiconductor Science and Technology

    2 publications · 130 citations

    2

    h-index

1–5