Carrier Mobility Extraction

Carrier Mobility Extraction is a methodological technique in semiconductor device characterization that distinguishes itself by quantifying the effective mobility of charge carriers in a material or device through the analysis of electrical transport measurements under controlled conditions.

403

Publications

20.3K

Citations

1.9K

Authors

512

Institutions

Publications per year

2017–2026

117

Authors

1.9K

  1. GG
    G. Ghibaudo

    Institut de Microélectronique, Electromagnétisme et Photonique, France

    19 publications · 1.5K citations

    14

    h-index

  2. GJ
    G. Juška

    Vilnius University, Lithuania

    8 publications · 501 citations

    8

    h-index

  3. SC
    S. Cristoloveanu

    Institut polytechnique de Grenoble, France

    6 publications · 122 citations

    6

    h-index

  4. FB
    F. Balestra

    Centre National de la Recherche Scientifique, France

    6 publications · 237 citations

    6

    h-index

  5. AO
    A. Ortíz-Conde

    Simón Bolívar University, Venezuela

    6 publications · 157 citations

    6

    h-index

1–5 of 1.9K

Venues

  1. IEEE Transactions on Electron Devices

    44 publications · 1.9K citations

    23

    h-index

  2. Journal of Applied Physics

    28 publications · 2K citations

    22

    h-index

  3. Applied Physics Letters

    37 publications · 1.2K citations

    20

    h-index

  4. Solid-State Electronics

    32 publications · 1.8K citations

    19

    h-index

  5. IEEE Electron Device Letters

    22 publications · 805 citations

    16

    h-index

1–5