A. Wei - Concepedia

Author

A. Wei

Massachusetts Institute of Technology ORCID

Also Known As

A. Wei, Amy Wei, Anlian Wei, Anying Wei, Sara Almutairi

Publications

1.4K

Citations

H-Index

Concepts

All Affiliations

Massachusetts Institute of Technology Naval Surface Warfare Center University of Arizona Analog Devices (United States)Sandia National Laboratories

About

A. Wei is an author at Massachusetts Institute of Technology specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	17	23	1.3K
2	Applied Physics	12	12	914
3	Computer Engineering	12	12	382
4	Health Sciences	1	1	112
5	Medicine	1	1	79

A. Wei

Publications

1.3K

Citations

H-Index

Page 1

	Year	Citations
Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates Daniel M. Fleetwood, S.L. Kosier, R.N. Nowlin, IEEE Transactions on Nuclear Science Electrical EngineeringSemiconductor DeviceEngineeringPhysicsStress-induced Leakage Current	1994	280
Charge separation for bipolar transistors S.L. Kosier, Ronald D. Schrimpf, R.N. Nowlin, IEEE Transactions on Nuclear Science EngineeringNet Positive OxideRadiation EffectCharge TransportSemiconductor Device	1993	199
Physically based comparison of hot-carrier-induced and ionizing-radiation-induced degradation in BJTs S.L. Kosier, A. Wei, Ronald D. Schrimpf, IEEE Transactions on Electron Devices EngineeringRadiation Materials ScienceRadiation PhysicsRadiation EffectRadiation Exposure	1995	112
Bounding the total-dose response of modern bipolar transistors S.L. Kosier, W.E. Combs, A. Wei, IEEE Transactions on Nuclear Science Device ModelingElectrical EngineeringTransistor GainEngineeringPhysics	1994	79
Effect of floating-body charge on SOI MOSFET design A. Wei, M. Sherony, D.A. Antoniadis IEEE Transactions on Electron Devices Device ModelingLow-power ElectronicsElectrical EngineeringSoi Mosfet DesignEngineering	1998	64
Integration and optimization of embedded-sige, compressive and tensile stressed liner films, and stress memorization in advanced SOI CMOS technologies L.T. Su, John Pellerin, Shih-Fen Huang, EngineeringVlsi DesignSilicon On InsulatorInterconnect (Integrated Circuits)Advanced Packaging (Semiconductors)	2005	63
HKMG process impact on N, P BTI: Role of thermal IL scaling, IL/HK integration and post HK nitridation K. Joshi, Shih‐Ya Hung, Subhadeep Mukhopadhyay, Materials ScienceMaterials EngineeringElectrical EngineeringEngineeringAdvanced Packaging (Semiconductors)	2013	60
Minimizing floating-body-induced threshold voltage variation in partially depleted SOI CMOS A. Wei, D.A. Antoniadis, Lawrence A. Bair IEEE Electron Device Letters Low-power ElectronicsDevice ModelingElectrical EngineeringEngineeringVlsi Design	1996	54
Dose-rate effects on radiation-induced bipolar junction transistor gain degradation A. Wei, S.L. Kosier, Ronald D. Schrimpf, Applied Physics Letters Device ModelingElectrical EngineeringEngineeringPhysicsDose-rate Effects	1994	50
Transient behavior of the kink effect in partially-depleted SOI MOSFET's A. Wei, M. Sherony, D.A. Antoniadis IEEE Electron Device Letters Device ModelingKink CharacteristicElectrical EngineeringEngineeringPhysics	1995	46

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