A.T. Wu - Concepedia

Author

A.T. Wu

University of California, Berkeley

Also Known As

A. T. Wu, A. Wu, A.T. Wu, A.T.-T. Wu, Angelica Wu, Anzhen Wu

Publications

581

Citations

H-Index

Concepts

All Affiliations

University of California, Berkeley Intel (United States)Hodges University Semiconductor Manufacturing International (Italy)Nagoya Institute of Technology

About

A.T. Wu is an author at University of California, Berkeley specializing in engineering, electrical engineering, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	19	528
2	Electrical Engineering	14	17	493
3	Applied Physics	13	15	437
4	Computer Engineering	2	2	63
5	Chemical Engineering	1	1	11

A.T. Wu

Publications

540

Citations

H-Index

Page 1

	Year	Citations
Deep-submicrometer MOS device fabrication using a photoresist-ashing technique J.E. Chung, M.-C. Jeng, J.E. Moon, IEEE Electron Device Letters Optical MaterialsEngineeringElectron-beam LithographyOptoelectronic DevicesIntegrated Circuits	1988	93
Asymmetrical characteristics in LDD and minimum-overlap MOSFET's T.Y. Chan, A.T. Wu, P.K. Ko, IEEE Electron Device Letters Device ModelingElectrical EngineeringIon ImplantationEngineeringNanoelectronics	1986	56
A novel high-speed, 5-volt programming EPROM structure with source-side injection A.T. Wu, T.Y. Chan, P.K. Ko, Low-power ElectronicsElectrical EngineeringEngineeringSource-side InjectionHigh Speed Programming	1986	47
Nitridation induced surface donor layer in silicon and its impact on the characteristics of n- and p-channel MOSFETs A.T. Wu, T.Y. Chan, V. Murali, EngineeringP-channel MosfetsOptoelectronic DevicesSilicon On InsulatorGate Dielectric	2003	42
Gate bias polarity dependence of charge trapping and time-dependent dielectric breakdown in nitrided and reoxidized nitrided oxides A.T. Wu, V. Murali, J. Nulman, IEEE Electron Device Letters SemiconductorsMaterials ScienceElectrical EngineeringElectronic DevicesCharge Trapping	1989	38
Effects of the gate-to-drain/source overlap on MOSFET characteristics T.Y. Chan, A.T. Wu, P.K. Ko, IEEE Electron Device Letters Device ModelingElectrical EngineeringPhysical Design (Electronics)EngineeringSemiconductor Device	1987	29
The effects of weak gate-to-drain(source) overlap on MOSFET characteristics P.K. Ko, T.Y. Chan, A.T. Wu, Device ModelingElectrical EngineeringEngineeringNanoelectronicsStress-induced Leakage Current	1986	28
Nucleation and defect generation in lattice matched and mismatched heteroepitaxial layers in the GaAs/Al<i>x</i>Ga1−<i>x</i>P/Si system T. George, E. R. Weber, Shinji Nozaki, Journal of Applied Physics EngineeringAl ContentHeteroepitaxial GrowthOptoelectronic DevicesSemiconductors	1990	23
Oxides grown on textured single-crystal silicon-dependence on process and application of EEPROMs Y. Fong, A.T. Wu, Chenming Hu IEEE Transactions on Electron Devices EngineeringCrystal Growth TechnologySilicon On InsulatorTextured Single-crystal Silicon-dependenceOxides Grown	1990	22
New mechanism for Si incorporation in GaAs-on-Si heteroepitaxial layers grown by metalorganic chemical vapor deposition Shinji Nozaki, J. J. Murray, A.T. Wu, Applied Physics Letters Electrical EngineeringEpitaxial GrowthEngineeringSi IncorporationNanoelectronics	1989	21

Page 1